MS221 - Modelling, Simulation, and AI for NDT and SHM

Organized by: F. Cui (Institute of High Performance Computing (IHPC, Singapore), M. Liu (Harbin Institute of Technology (Shenzhen), China), Y. Hu (East China University of Science and Technolo, China) and G. Chen (Dongguan University of Technology, China)
Keywords: AI, modeling and simulation, NDT, SHM, Signal Processing
Non-destructive testing (NDT) and structural health monitoring (SHM) are critical for ensuring quality in both the manufacturing and operational phases of various structures. This mini-symposium aims to present and discuss recent advancements in various NDT and SHM technologies (Visual, ultrasonic, thermographic, eddy current, acoustic emission, magnetic, etc.). It includes but not limited to: i) Computational modelling methods; ii) Novel methods, approaches, and software integrated with advanced sensor technologies; iii) Signal processing algorithms, feature extraction, and damage indicators; and iv) AI-based methods for enhancing the effectiveness and efficacy of defect detection in NDT and SHM.