Determining Weaknesses in Structures from Fiber-Optic Measurement Devices
Please login to view abstract download link
The determination of material properties (or weaknesses) may be formulated as an optimization problem where the cost function is given by some norm of the difference between measured and computed values at given sensor locations. As the cost function depends on the material parameters (e.g. a weakness factor) and the structures obey the laws governing structural mechanics, the most economic way to approach this problem is via adjoints. While up to now the number of (point) sensors was restricted due to cost and difficulties of installation, the advent of embedded fiber-optic measuring devices should allow for higher spatial precision. At the same time, such a `continuous' (lower dimensional) line embedded in a 2D or 3D structure can be handled in a variety of ways, requiring mathematical analysis. The aim of this paper is to summarize the experiences gained in using fiber-optic measuring devices in order to determine weaknesses in structures.
